ICMTD'07
It is our pleasure to welcome you at the 2nd International Conference on Memory Technology and Design ICMTD-2007, which is held from May 7th-10th 2007, again on the Peninsula of Giens at the Mediterranean coast of France.
This conference -this year being organized by the Interuniversity Microelectronics Center (IMEC), Leuven, Belgium, the Provence Materials and Microelectronics Laboratory (L2MP), Marseille, France, and the Catholic University of Leuven, Belgium- was originally created to provide an international forum for presentations and discussions on recent developments in Memory Technology and Design. All aspects of memory devices, circuits, process technologies, materials and other related research are within the scope of the conference. These three days of presentations, in oral presentations and panel discussions, provide extensive opportunities for technical information exchange. Furthermore we expect that the conference settings and social events (incl. an excursion to the Porquerolles Island) will further stimulate informal communication among participants.
49 papers have been selected for oral presentations and have been organized in 8 sessions, 6 of which being organized in parallel. Additionally, these sessions include 11 invited papers from experts in the field: |
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- C. Hirst (Gartner Dataquest) - Memory market update: shifting dynamics
- A. Niebel (Webfeet Research) - Living with the DRAMification of NAND - How to survive the Flash Price Wars
- I. Verbauwhede (KUL) - Secure memories: dream or reality?
- D. Keitel-Schulz (Qimonda) - From memory component to memory systems
- P. Marchal (IMEC) - A designer’s perspective on future memory architectures for software defined radios
- R. Zambrano (ST Incard) - Smart cards: technologies and products
- H.-L. Lung (Macronix) - Phase-Change Memory – Present and Future
- A. Bergemont (Maxim Integrated Products) - Current limitations of floating gate NVM and new alternatives
- S. Ueno (Renesas) - Magnetic RAM for embedded memory in SoC
- T.-N. Fang (Spansion) - Copper oxide resistive switching for non-volatile memory applications
- J.-L. Autran (L2MP) - Real-time soft-error rate testing of semiconductor memories on the european test platform ASTEP
One session deals with the exciting topic of FinFet-based Flash technology and is organized as an open workshop of the IST-FinFlash project nr. FP6-016917.
Besides these paper sessions, we also invite you to participate in 3 panel discussions :
- "Charge-based versus resistance-based non-volatile memory " - Moderator: D. Wouters (IMEC) - Panelists: J. Park (Samsung), H.-L. Lung (Macronix), S. Ueno (Renesas), R. Waser (RWTH Aachen), A. Wild (Freescale)
- "SOI and new memory opportunities " - Moderator: C. Hirst (Gartner Dataquest) - Panelists: P. Fazan (Innovative Silicon), K. Itoh (Hitachi), S. Natarajan (Emerging Memory Technologies), M. Shaheen (SOITEC), D. Somasekhar (Intel)
- "Memory design in 45nm and beyond: how to survive the technology scaling " - Moderator: W. Dehaene (KUL) - Panelists: D. Heslinga (NXP Semiconductors), D. Keitel-Schulz (Qimonda), P. Marchal (IMEC), I. Verbauwhede (KUL)
The conference also provides a limited number of posters from various memory-related European projects which can be discussed with the authors during coffee and lunch breaks.
We are confident that this conference will be an exciting event for each attendee and we would like to thank all participants for their valuable contributions to the conference.
Furthermore, w e would like to express our gratitude to the Scientific/Technical committee for their review of contributed papers and to our sponsors for their financial and technical support.
Finally we would like to thank all who contributed to the organisation and implementation of the
ICMTD-2007 conference.
We wish you a pleasant and fruitful conference,
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Jan Van Houdt, 2007 General Chairman
On behalf of the organization and steering committees
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